VT Series
Application
Cantilever probe cards structurally restrict multi-DUT testing for devices with peripheral pads. VT Series uses a vertical structure, which solves DUT restrictions and improves electrical properties.
VT Series is a probe card technology designed for multi-DUT testing of logic devices with fine-pitch peripheral pads.
Features
1.
Ideal for devices with small pad sizes and fine pitch due to small probe marks
2.
Capable of supporting various pad layouts
3.
No restrictions on corner pads and no need for skipped row
4.
Enables testing over wide temperature range
5.
Stable contact on aluminum pads
6.
Individual pin replacement is feasible.
Specifications [fine‐pitch peripheral PAD]
| Pitch (um) | 50 |
| Pad size(um) | 38 |
| Number of pins | 10K |
| Probing area(um) | 100×100 |
| Contact Force (gf) | 2 |
| Max OD (um) | 100 |
| Temperature range(℃) | XP2：-40/175 |
| XP3：-40/125 | |
| Max. DC current (A) CCC | XP2：0.245 |
| XP3：0.375 | |
| Frequency(Gbps) | 0.75 |
*specifications are subject to change without notice
Contact